Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)

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Title:          Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
Subject:        Springer
Keywords:       ISBN-13:    9783540284055
Author:         G. Kaupp
Creator:        dvips(k) 5.94b Copyright 2004 Radical Eye Software
Producer:       Acrobat Distiller 6.0.1 (Windows)
CreationDate:   Thu Oct 12 16:00:58 2006
ModDate:        Sat Jul 18 22:25:52 2009
Tagged:         no
Form:           AcroForm
Pages:          302
Encrypted:      no
Page size:      335 x 515 pts
Page rot:       0
File size:      18725133 bytes
Optimized:      no
PDF version:    1.4